DocumentCode :
2607691
Title :
Accelerated Life Testing for LSI Failure Mechanisms
Author :
Zierdt, C.H., Jr.
Author_Institution :
Bell Telephone Laboratories, Allentown, Pennsylvania 18103. (215) 439-7500
fYear :
1978
fDate :
28581
Firstpage :
76
Lastpage :
78
Keywords :
Acceleration; Circuit testing; Failure analysis; Large scale integration; Life estimation; Life testing; Radiation detectors; Stress; Temperature distribution; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1978. 16th Annual
Conference_Location :
San Diego, CA, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1978.362823
Filename :
4208213
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2607691
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