DocumentCode
2607691
Title
Accelerated Life Testing for LSI Failure Mechanisms
Author
Zierdt, C.H., Jr.
Author_Institution
Bell Telephone Laboratories, Allentown, Pennsylvania 18103. (215) 439-7500
fYear
1978
fDate
28581
Firstpage
76
Lastpage
78
Keywords
Acceleration; Circuit testing; Failure analysis; Large scale integration; Life estimation; Life testing; Radiation detectors; Stress; Temperature distribution; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1978. 16th Annual
Conference_Location
San Diego, CA, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1978.362823
Filename
4208213
Link To Document