• DocumentCode
    260770
  • Title

    Analyzing the effect of bagged ensemble approach for software fault prediction in class level and package level metrics

  • Author

    Shanthini, A. ; Chandrasekaran, R.M.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Annamalai Univ., Annamalai Nagar, India
  • fYear
    2014
  • fDate
    27-28 Feb. 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Faults in a module tend to cause failure of the software product. These defective modules in the software pose considerable risk by increasing the developing cost and decreasing the customer satisfaction. Hence in a software development life cycle it is very important to predict the faulty modules in the software product. Prediction of the defective modules should be done as early as possible so as to improve software developers´ ability to identify the defect-prone modules and focus quality assurance activities such as testing and inspections on those defective modules. For quality assurance activity, it is important to concentrate on the software metrics. Software metrics play a vital role in measuring the quality of software. Many researchers focused on classification algorithm for predicting the software defect. On the other hand, classifiers ensemble can effectively improve classification performance when compared with a single classifier. This paper mainly addresses using ensemble approach of Support Vector Machine (SVM) for fault prediction. Ensemble classifier was examined for Eclipse Package level dataset and NASA KC1 dataset. We showed that proposed ensemble of Support Vector Machine is superior to individual approach for software fault prediction in terms of classification rate through Root Mean Square Error Rate (RMSE), AUC-ROC, ROC curves.
  • Keywords
    pattern classification; software fault tolerance; software metrics; software quality; support vector machines; AUC-ROC; Eclipse Package level dataset; NASA KC1 dataset; RMSE; SVM; bagged ensemble approach; class level metrics; classification algorithm; classifiers ensemble; defect-prone modules; defective modules prediction; faulty modules prediction; package level metrics; quality assurance activities; root mean square error rate; software defect prediction; software development life cycle; software fault prediction; software metrics; software product failure; software quality; support vector machine; Bagging; Predictive models; Root mean square; Software; Software metrics; Support vector machines; class level metrics; defect prediction; machine learning; method level metrics; software metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Communication and Embedded Systems (ICICES), 2014 International Conference on
  • Conference_Location
    Chennai
  • Print_ISBN
    978-1-4799-3835-3
  • Type

    conf

  • DOI
    10.1109/ICICES.2014.7033809
  • Filename
    7033809