DocumentCode
2607712
Title
Process Testing for Reliability Control
Author
Schroen, Walter H.
Author_Institution
Texas Instruments Incorporated, Dallas, Texas 75265. 214-238-2862
fYear
1978
fDate
28581
Firstpage
81
Lastpage
87
Keywords
Circuit testing; Failure analysis; Integrated circuit reliability; Integrated circuit testing; Life estimation; Life testing; Microprocessors; Process control; Stress; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1978. 16th Annual
Conference_Location
San Diego, CA, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1978.362825
Filename
4208215
Link To Document