DocumentCode :
2607728
Title :
Test Chips in LSI Reliability Assurance
Author :
Griswold, T.W.
Author_Institution :
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91103. (213) 354-4145
fYear :
1978
fDate :
28581
Firstpage :
88
Lastpage :
88
Keywords :
Circuit testing; Electric variables measurement; History; Integrated circuit reliability; Integrated circuit testing; Laboratories; Large scale integration; Materials testing; Propulsion; Qualifications;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1978. 16th Annual
Conference_Location :
San Diego, CA, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1978.362826
Filename :
4208216
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2607728
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