• DocumentCode
    2607728
  • Title

    Test Chips in LSI Reliability Assurance

  • Author

    Griswold, T.W.

  • Author_Institution
    Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91103. (213) 354-4145
  • fYear
    1978
  • fDate
    28581
  • Firstpage
    88
  • Lastpage
    88
  • Keywords
    Circuit testing; Electric variables measurement; History; Integrated circuit reliability; Integrated circuit testing; Laboratories; Large scale integration; Materials testing; Propulsion; Qualifications;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1978. 16th Annual
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1978.362826
  • Filename
    4208216
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2607728