• DocumentCode
    2607788
  • Title

    A Novel SLM Method for PAPR Reduction of OFDM System

  • Author

    Ning, Lei ; Yang, Mingchuan ; Wang, Zhenyong ; Guo, Qing

  • Author_Institution
    Commun. Res. Center, Harbin Inst. of Technol., Harbin, China
  • fYear
    2012
  • fDate
    6-9 May 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Given that the conventional Selected Mapping (SLM) scheme needs to multiply pseudo-random phase sequences to the transmitted data meanwhile transmitting the whole side information, an exhaustive entropy and chaotic phase sequence based SLM method was proposed for reduction the peak-to-average power ratio (PAPR) of Orthogonal frequency division multiplexing (OFDM) in the paper. In the novel algorithm, exhaustive entropy was used to evaluate the randomness of phase sequence, chaotic sequences to reduce the large side information and improved Lorenz sequence digitalization method to enlarge sequence entropy, expanding the number of the candidate phase sequences vector space with the lower transmitted parameters of phase sequence. Simulation results show that different quantization methods of chaotic sequence have different exhaustive entropy and PAPR values. Furthermore, compared with the traditional SLM method, the new scheme proposed in the paper has better performance in reducing PAPR of OFDM system by about 0.1-0.5dB.
  • Keywords
    OFDM modulation; chaotic communication; entropy codes; quantisation (signal); random sequences; Lorenz sequence digitalization; OFDM system; PAPR reduction; SLM method; chaotic phase sequence; chaotic sequences; exhaustive entropy; orthogonal frequency division multiplexing; peak-to-average power ratio; phase sequence randomness; pseudorandom phase sequences; quantization; selected mapping scheme; transmitted parameters; Chaotic communication; Entropy; Peak to average power ratio; Quantization; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference (VTC Spring), 2012 IEEE 75th
  • Conference_Location
    Yokohama
  • ISSN
    1550-2252
  • Print_ISBN
    978-1-4673-0989-9
  • Electronic_ISBN
    1550-2252
  • Type

    conf

  • DOI
    10.1109/VETECS.2012.6239879
  • Filename
    6239879