Title :
Characterization of nanophotonic structures using the finite element method
Author :
Bardi, Istvan ; Vardapetyan, Leon ; Manges, John
Author_Institution :
ANSYS Inc., Pittsburgh, PA, USA
Abstract :
Gaussian beam excitations are applied to extract S parameters of nanophotonic structures. A method for calculating the complex propagation constant of periodic structures is also presented including a novel iterative eigenvalue solver which is applicable to large sparse matrices and gives the flexibility to calculate just the desired dominant eigenvalues.
Keywords :
eigenvalues and eigenfunctions; finite element analysis; nanophotonics; Gaussian beam excitations; dominant eigenvalues; extract S parameters; finite element method; nanophotonic structures; Eigenvalues and eigenfunctions; Finite element methods; Iterative methods; Nanostructures; Optical surface waves; Optical waveguides; Periodic structures; Propagation constant; Scattering parameters; Transmission line matrix methods;
Conference_Titel :
Electromagnetic Field Computation (CEFC), 2010 14th Biennial IEEE Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7059-4
DOI :
10.1109/CEFC.2010.5481331
