• DocumentCode
    2607816
  • Title

    Analytical model for nanowire and nanotube transistors covering both dissipative and ballistic transport

  • Author

    Mugnaini, Giorgio ; Iannaccone, Giuseppe

  • Author_Institution
    Dipt. di Ingegneria dell´´Informazione: Informatica, Elettronica, Telecomunicazioni, Universita di Pisa, Italy
  • fYear
    2005
  • fDate
    12-16 Sept. 2005
  • Firstpage
    213
  • Lastpage
    216
  • Abstract
    We present an analytical model for silicon nanowire and carbon nanotube transistors that allows us to seamless cover the whole range of transport regimes from drift-diffusion to ballistic, taking into account the one-dimensional electron or hole gas in the channel. We propose an analytical description of the transition from drift-diffusion to ballistic transport based on the Buttiker approach to dissipative transport. We start from the derivation of an analytical expression for ballistic nanowire transistors and show that a generic transistor with finite scattering length can be described as a chain of elementary ballistic transistors. Then, we are able to compact the behavior of an arbitrary ballistic chain in a simple analytical model, suitable for circuit simulators. In the derivation of the model, we find a relation between the mobility and the mean free path that has deep consequences on the understanding of transport in nanoscale devices.
  • Keywords
    ballistic transport; electron gas; field effect transistors; nanoelectronics; nanotube devices; nanowires; semiconductor device models; Buttiker approach; analytical model; ballistic transistors; ballistic transport; carbon nanotube transistors; circuit simulation; dissipative transport; drift diffusion; finite scattering length; generic transistor; nanoscale devices; nanowire transistors; one dimensional hole gas; one-dimensional electron gas; Analytical models; Ballistic transport; Carbon nanotubes; Light scattering; MOSFETs; Particle scattering; Quantum capacitance; Silicon; Telecommunications; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European
  • Print_ISBN
    0-7803-9203-5
  • Type

    conf

  • DOI
    10.1109/ESSDER.2005.1546623
  • Filename
    1546623