Title :
Metric tree partitioning and Taylor approximation for fast support vector classification
Author :
Pham, Thang V. ; Smeulders, Arnold W M
Author_Institution :
Fac. of Sci., Amsterdam Univ.
Abstract :
This paper presents a method to speed up support vector classification, especially important when data is high-dimensional. Unlike previous approaches which focus on less support vectors, we partition the data space into local regions, and perform approximation by linear functions. The experimental results on 31 datasets show that the performance degrades marginally, while the speedup is significant, up to three orders of magnitude
Keywords :
approximation theory; pattern classification; support vector machines; trees (mathematics); Taylor approximation; linear function; metric tree partitioning; support vector classification; Approximation algorithms; Classification tree analysis; Data structures; Degradation; Gaussian processes; Kernel; Linear approximation; Support vector machine classification; Support vector machines; Testing;
Conference_Titel :
Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
0-7695-2521-0
DOI :
10.1109/ICPR.2006.795