Title :
Trends in Packaging Technology
Author :
Gedney, Ronald W.
Author_Institution :
IBM Corporation, Endicott, New York 13760. (607) 755-2000
Keywords :
Chip scale packaging; Costs; Electronics packaging; Integrated circuit interconnections; Integrated circuit reliability; Large scale integration; Pins; Production; Semiconductor device packaging; Substrates;
Conference_Titel :
Reliability Physics Symposium, 1978. 16th Annual
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/IRPS.1978.362834