Title :
SPICE-simulation of nonlinear effects in field-effect-transistors caused by thermal power feedback
Author :
Schurack, E. ; Latzel, T. ; Gottwald, A.
Author_Institution :
Inst. for Commun. Eng., Federal Armed Forces Univ. Munich, Neubiberg, Germany
Abstract :
In order to evaluate the influence of the internal power-dependent-thermally-effected feedback in field-effect-transistors, a model for simulated program with IC emphasis (SPICE) simulation is proposed. It considers several variable temperature influences on transistor parameters, as well as a complex thermal network. Examples for both static and dynamic simulation are presented
Keywords :
SPICE; digital simulation; feedback; field effect transistors; semiconductor device models; SPICE-simulation; complex thermal network; field-effect-transistors; nonlinear effects; static simulation; thermal power feedback; transistor parameters; variable temperature influences; Circuit simulation; FETs; Fluctuations; Force feedback; Power dissipation; SPICE; Temperature dependence; Thermal engineering; Thermal force; Threshold voltage;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1281-3
DOI :
10.1109/ISCAS.1993.393931
