Title :
Low-cost strategies for testing multi-gigahertz SOPs and components
Author :
Keezer, David C. ; Davis, J.S. ; Bezos, S. ; Minier, D. ; Caron, M.C. ; Bergman, Keren ; Liboiron-Labouceur, O.
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This presentation provides a summary and status of three on-going research projects that are developing new low-cost techniques for testing devices with multiple signals of high-speed (>1 GHz) data. Each project uses commercially available components to keep costs low, and provides the circuits necessary for testing specific applications. This presentation provides a summary of these projects, recent achievements, and future directions as they might apply to testing system-on-package (SOP) and other components.
Keywords :
automatic test equipment; chip scale packaging; demultiplexing equipment; integrated circuit testing; multiplexing equipment; production testing; telecommunication equipment testing; at-speed functional testing; automated test systems; commercially available components; customized circuits; demultiplexers; emitter-coupled logic; high-speed data; low-cost techniques; multiple signals; multiplexers; optoelectronic test bed; output eye diagram; production testing; system-on-package components; test support processor; wafer-level packaged devices; Accuracy; Automatic testing; Circuit testing; Clocks; High speed optical techniques; Logic testing; Sampling methods; System testing; Test equipment; Timing;
Conference_Titel :
Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
Print_ISBN :
0-7803-8205-6
DOI :
10.1109/EPTC.2003.1271556
