Title :
Organic CuTCNQ nonvolatile memories for integration in the CMOS backend-of-line: preparation from gas/solid reaction and downscaling to an area of 0.25 μm2
Author :
Müller, Robert ; De Jonge, Stijn ; Myny, Kris ; Wouters, Dirk ; Genoe, Jan ; Heremans, Paul
Author_Institution :
IMEC, Leuven, Belgium
Abstract :
CuTCNQ is an organic semiconductor charge transfer material that allows the realization of nonvolatile cross-bar memory arrays with conductivity switching. In this work, we present a simple preparation method of this organic memory material, compatible with industrial processing and downsizing of the memory cells. CuTCNQ was prepared on Cu by a solid-gas phase corrosion reaction between the metal and hot TCNQ gas at low pressure. Surface coverage increased with reaction time and temperature. Cu/CuTCNQ/Al cross-point cell arrays with memory areas of 0.01 mm2 exhibited I-V curved with ON/OFF current ratios of about 10. Further downscaling of the memory elements was successful to an area of 0.25 μm2 . Corresponding memories achieved ON/OFF current ratio of about 700. This is, to our knowledge, the first report on downscaling of organic memories to 0.25 μm2.
Keywords :
CMOS memory circuits; materials preparation; organic semiconductors; CMOS backend-of-line process; Cu; charge transfer material; conductivity switching; cross point cell arrays; downscaling process; gas-solid reaction; material preparation; nonvolatile cross-bar memory arrays; organic CuTCNQ nonvolatile memories; organic memory material; organic semiconductor materials; solid-gas phase corrosion reaction; surface coverage; Charge transfer; Conducting materials; Conductivity; Corrosion; Nonvolatile memory; Organic materials; Organic semiconductors; Semiconductor materials; Solids; Temperature;
Conference_Titel :
Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European
Print_ISBN :
0-7803-9203-5
DOI :
10.1109/ESSDER.2005.1546635