• DocumentCode
    2608085
  • Title

    Reliability Testing of Fluorinated Polymeric Materials (FNP) for Hybrid Encapsulation

  • Author

    Christou, A. ; Griffith, J.R. ; Wilkins, W.

  • Author_Institution
    Naval Research Laboratory, Washington, D. C. 20375. 202-767-2799
  • fYear
    1978
  • fDate
    28581
  • Firstpage
    194
  • Lastpage
    199
  • Abstract
    A new class of polymeric materials synthesized from fluorinated percursors to produce network molecules of epoxies and polyurethanes has been analyzed as a hybrid encapsulation material. The fluorinated resin (C-3) synthesized at NRL consists of approximately 50% fluorine by weight, is a liquid at room temperature and can be readily cured to the solid state. For encapsulation, the surface of the hybrids or devices was primed first with a fluoroacrylate barrier film and the C-3 resin with a cycloaliphatic diamine curing agent was used for encapsulation. Utilizing test structures, a micro-thin film (Au-Al2O3) moisture sensors and Auger/SIMS analysis, the moisture penetration kinetics for the fluorinated network polymeric materials (FNP) has been determined. It was determined that the activation energy for moisture penetration remained constant from 20 to 95% relative humidity. The measured activation energy varied from 1.9 eV at 20% RH to 2.0 eV at 95% RH. Interdigitated test structures were utilized in order to study the migrative resistive short (MGRS) phenomenon in the hybrids encapsulated with the FNP material. The results shox that for a surface ionic contamination level of 1014 Na+/cm2 on the encapsulant surface, relative humidity of 95% and temperature cycle of +100°C to (¿10°C) migrative resistance shorts were not observed after 100 cycles of total duration of 4 hours per cycle. A similar test with silicone materials resulted in MGRS formation after eight cyclet. Additional tests were conducted for Cl-, S= and K+.
  • Keywords
    Encapsulation; Humidity; Materials reliability; Materials testing; Moisture; Network synthesis; Polymer films; Resins; Surface contamination; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1978. 16th Annual
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1978.362845
  • Filename
    4208235