Simulating High Impulse Voltage Circuits for Testing Winding Type Equipment

Author

Pereira, C.E.R. ; Filho, O.O. ; Lima, Antonio C S

Author_Institution

Electr. Power Res. Center, CEPEL, Nova Iguacu, Brazil

fYear

2008

fDate

9-12 Nov. 2008

Firstpage

351

Lastpage

354

Abstract

This paper deals with the fine tuning of high voltage circuits parameters for impulse voltage tests. The equipment involved in the test is prior subjected to a frequency domain fitting based on vector fitting (VF) and later implemented in ATP-EMTP. The simulation results are used to verify the adequacy of the actual experimental tests. Comparison between experimental and simulated setup indicate that the deviations are below the lever of the uncertainties of the measuring systems.

Keywords

impulse testing; measurement uncertainty; pulse generators; test equipment; transformer testing; ATP-EMTP implemention; equipment under test; frequency domain fitting; high impulse voltage circuits parameters; impulse generator; impulse testing; measuring system uncertainties; transformer testing; vector fitting; winding type equipment testing; Atmospheric modeling; Circuit simulation; Circuit testing; Fitting; Frequency domain analysis; Impedance; Impulse testing; Mathematical model; Resistors; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on

Conference_Location

Chongqing

Print_ISBN

978-1-4244-3823-5

Electronic_ISBN

978-1-4244-2810-6

Type

conf

DOI

10.1109/ICHVE.2008.4773945

Filename

4773945