Title :
Magnetic sensing as signal integrity monitoring in integrated circuits
Author :
Gutiérrez-D, Edmundo A. ; Torres-R, Emmanuel ; T, Reydezel Torres
Author_Institution :
Dept. of Electron., INAOE, Puebla, Mexico
Abstract :
We present experimental and simulations results of a magnetic sensor (MAGFET) used as built-in monitor of signal integrity in interconnect lines of integrated circuits. The magnetic signal generated by the electrical signal flowing through the interconnect lines, is sensed by the MAGFET. This way we monitor signal integrity without adding an extra electrical load to the line.
Keywords :
field effect devices; integrated circuit interconnections; integrated circuit testing; magnetic field measurement; magnetic sensors; monitoring; MAGFET sensor; built-in monitor; integrated circuits interconnect lines; magnetic sensing; magnetic sensor; signal integrity monitoring; Circuit simulation; Computational modeling; Electron mobility; Integrated circuit interconnections; Integrated circuit modeling; Magnetic field measurement; Magnetic fields; Magnetic sensors; Monitoring; Signal generators;
Conference_Titel :
Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European
Print_ISBN :
0-7803-9203-5
DOI :
10.1109/ESSDER.2005.1546639
