DocumentCode :
2608161
Title :
Degradation of PVF2 Capacitors During Accelerated Tests
Author :
Burough, J.W. ; Brammer, W.G. ; Burnham, John
Author_Institution :
Hughes Aircraft Company, Technical Services Division, Culver City, CA 90230. (213) 391-0711
fYear :
1978
fDate :
28581
Firstpage :
219
Lastpage :
223
Keywords :
Capacitance; Capacitors; Degradation; Electrical resistance measurement; Electrodes; Insulation; Life estimation; Life testing; Metallization; Optical films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1978. 16th Annual
Conference_Location :
San Diego, CA, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1978.362849
Filename :
4208239
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2608161
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