DocumentCode
2608193
Title
Calculation and Analysis of the Coupling Effects of the Ultra High Voltage Double-circuit Transmission Lines
Author
Sun, Qiuqin ; Wang, Guan ; Li, Qingmin ; Li, Qingquan
Author_Institution
Sch. of Electr. Eng., ShanDong Univ., Jinan, China
fYear
2008
fDate
9-12 Nov. 2008
Firstpage
366
Lastpage
370
Abstract
There exist serious coupling effects between the ultra high voltage(UHV) double-circuit transmission lines. In spite of elucidating detailedly both the static and the electromagnetic coupling mechanisms, the impacts of the line transposition mode on the induced voltages and currents are analyzed via established equivalent circuit model. As a case study which incorporates UHV double-circuit lines to be built in east China, the induced voltage and current along the maintenance line under different conditions have been calculated through ATP-EMTP. Specifically, the influence of both the compensation factor and the neutral reactor value on the induced voltages along the maintenance line is investigated while shunt reactors are installed, which indicates that extremely high induced resonant overvoltage may potentially happen in some critical cases. The research results present useful reference for future construction of the UHV double-circuit transmission lines.
Keywords
EMTP; electromagnetic coupling; electrostatics; equivalent circuits; power transmission lines; ATP-EMTP; compensation factor; coupling effects; electromagnetic coupling; equivalent circuit model; line transposition mode; neutral reactor value; shunt reactors; ultra high voltage double-circuit transmission lines; Coupling circuits; Distributed parameter circuits; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic modeling; Equivalent circuits; Inductors; Shunt (electrical); Transmission lines; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
Conference_Location
Chongqing
Print_ISBN
978-1-4244-3823-5
Electronic_ISBN
978-1-4244-2810-6
Type
conf
DOI
10.1109/ICHVE.2008.4773949
Filename
4773949
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