• DocumentCode
    2608193
  • Title

    Calculation and Analysis of the Coupling Effects of the Ultra High Voltage Double-circuit Transmission Lines

  • Author

    Sun, Qiuqin ; Wang, Guan ; Li, Qingmin ; Li, Qingquan

  • Author_Institution
    Sch. of Electr. Eng., ShanDong Univ., Jinan, China
  • fYear
    2008
  • fDate
    9-12 Nov. 2008
  • Firstpage
    366
  • Lastpage
    370
  • Abstract
    There exist serious coupling effects between the ultra high voltage(UHV) double-circuit transmission lines. In spite of elucidating detailedly both the static and the electromagnetic coupling mechanisms, the impacts of the line transposition mode on the induced voltages and currents are analyzed via established equivalent circuit model. As a case study which incorporates UHV double-circuit lines to be built in east China, the induced voltage and current along the maintenance line under different conditions have been calculated through ATP-EMTP. Specifically, the influence of both the compensation factor and the neutral reactor value on the induced voltages along the maintenance line is investigated while shunt reactors are installed, which indicates that extremely high induced resonant overvoltage may potentially happen in some critical cases. The research results present useful reference for future construction of the UHV double-circuit transmission lines.
  • Keywords
    EMTP; electromagnetic coupling; electrostatics; equivalent circuits; power transmission lines; ATP-EMTP; compensation factor; coupling effects; electromagnetic coupling; equivalent circuit model; line transposition mode; neutral reactor value; shunt reactors; ultra high voltage double-circuit transmission lines; Coupling circuits; Distributed parameter circuits; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic modeling; Equivalent circuits; Inductors; Shunt (electrical); Transmission lines; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4244-3823-5
  • Electronic_ISBN
    978-1-4244-2810-6
  • Type

    conf

  • DOI
    10.1109/ICHVE.2008.4773949
  • Filename
    4773949