Title :
Simplified digital calibration for multi-stage analog-to-digital converters
Author :
Lee, Seung-Hoon ; Song, Bang-Sup
Author_Institution :
Analog Devices Semiconductor, Wilmington, MA, USA
Abstract :
A digital-domain code-error calibration, modified to work with a reduced number of error measurements, greatly simplifies the task of self-calibrating multi-step analog-digital converters (ADCs) and opens up the possibility of moving all self-calibration hardwares into the digital domain, leaving only switching functions for calibration in the analog domain. By digitally subtracting pro-rated interstage gain errors from the code errors of the following stage, the proposed method achieves gain matching between multistage code errors individually measured. Simulations of multi-step ADCS based on a capacitor-array multiplying digital-analog converter (MDAC) demonstrate a substantial saving in the number of measured code errors and digital computations during normal conversions
Keywords :
analogue-digital conversion; calibration; coding errors; capacitor-array multiplying digital-analog; digital calibration; digital-domain code-error calibration; gain matching; interstage gain errors; multi-step analog-digital converters; multistage ADC; self-calibration hardwares; Analog-digital conversion; Calibration; Capacitors; Circuits; Computer errors; Error correction; Hardware; Linearity; Nonvolatile memory; Switching converters;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1281-3
DOI :
10.1109/ISCAS.1993.393947