• DocumentCode
    2608216
  • Title

    Simplified digital calibration for multi-stage analog-to-digital converters

  • Author

    Lee, Seung-Hoon ; Song, Bang-Sup

  • Author_Institution
    Analog Devices Semiconductor, Wilmington, MA, USA
  • fYear
    1993
  • fDate
    3-6 May 1993
  • Firstpage
    1216
  • Abstract
    A digital-domain code-error calibration, modified to work with a reduced number of error measurements, greatly simplifies the task of self-calibrating multi-step analog-digital converters (ADCs) and opens up the possibility of moving all self-calibration hardwares into the digital domain, leaving only switching functions for calibration in the analog domain. By digitally subtracting pro-rated interstage gain errors from the code errors of the following stage, the proposed method achieves gain matching between multistage code errors individually measured. Simulations of multi-step ADCS based on a capacitor-array multiplying digital-analog converter (MDAC) demonstrate a substantial saving in the number of measured code errors and digital computations during normal conversions
  • Keywords
    analogue-digital conversion; calibration; coding errors; capacitor-array multiplying digital-analog; digital calibration; digital-domain code-error calibration; gain matching; interstage gain errors; multi-step analog-digital converters; multistage ADC; self-calibration hardwares; Analog-digital conversion; Calibration; Capacitors; Circuits; Computer errors; Error correction; Hardware; Linearity; Nonvolatile memory; Switching converters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • DOI
    10.1109/ISCAS.1993.393947
  • Filename
    393947