DocumentCode :
2608293
Title :
Reliability Study of High Efficiency Gallium Arsenide Avalanche Diodes
Author :
Heaton, John L. ; Walline, Robert E. ; Carroll, John F.
Author_Institution :
Microwave Associates, Inc., Burlington, Massachusetts 01803. Telephone No. (617) 272-3000
fYear :
1978
fDate :
28581
Firstpage :
261
Lastpage :
267
Keywords :
Breakdown voltage; Electromagnetic heating; Gallium arsenide; Gold; Life testing; Microwave devices; Platinum; Radio frequency; Schottky diodes; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1978. 16th Annual
Conference_Location :
San Diego, CA, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1978.362856
Filename :
4208246
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2608293
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