• DocumentCode
    2608341
  • Title

    Quantum bit controller and observer circuits in SOS-CMOS technology for gigahertz low-temperature operation

  • Author

    Ekanayake, S. Ramesh ; Lehmann, Torsten ; Dzurak, Andrew S. ; Clark, Robert G.

  • Author_Institution
    Australian Res. Council Center of Excellence for Quantum Comput. Technol., Univ. of New South Wales, Kensington, NSW
  • fYear
    2007
  • fDate
    2-5 Aug. 2007
  • Firstpage
    1283
  • Lastpage
    1287
  • Abstract
    Quantum bit (qubit) control and readout requires controller-qubit-observer systems for rapid control signal generation and injection to the qubit gates, and observation of their final state projections. Conventionally, for solid-state qubits, this is achieved by generating the control signal at 300 K and transmitting it along very long coaxial cables that span from 300 K to sub-K (typically les 500 mK), then reading out the response from charge proximity sensors such as single-electron transistors along similar lengths of cable. Our approach is to fabricate the classical controller and observer circuits using a commercial foundry processed silicon-on-sapphire (SOS) RFCMOS technology for operation at low temperatures (either at 4.2 K, 1 K, or sub-K). We have demonstrated SOS-CMOS NFET and PFET device operation at 4.2 K, and sub-K that showed deviations from their 300 K characteristics, but with further experiments these were shown to have minimal effects on control circuit function. Using these results, we have fabricated and demonstrated a low-power proof-of-concept SOS-CMOS controller circuit (monostable 100 ps voltage-pulse generator) that can operate at sub-K temperatures in a dilution refrigerator. We briefly discuss experimental and conceptual schemes with which we can develop qubit control systems for cryogenic and lower temperatures. These low temperature experiments also demonstrate that commercial SOS RF-CMOS technology can be feasible for other low temperature and low power applications.
  • Keywords
    CMOS integrated circuits; field effect transistor circuits; readout electronics; single electron transistors; RFCMOS technology; SOS-CMOS technology; charge proximity sensors; observer circuits; quantum bit controller; readout; single-electron transistors; temperature 1 K; temperature 300 K; temperature 4.2 K; Coaxial cables; Control systems; Foundries; Signal generators; Single electron transistors; Solid state circuits; Superconducting cables; Temperature control; Temperature sensors; Voltage control; CMOSFETs; control systems; cryogenic electronics; quantum effect semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2007. IEEE-NANO 2007. 7th IEEE Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-0607-4
  • Electronic_ISBN
    978-1-4244-0608-1
  • Type

    conf

  • DOI
    10.1109/NANO.2007.4601417
  • Filename
    4601417