Title :
Do hot electrons produce excess noise?
Author :
Jungemann, Christoph ; Meinerzhagen, Bernd
Author_Institution :
NST, TU Braunschweig, Germany
Abstract :
The open question whether excess noise is due to hot electrons or not is addressed for the first time by solving the Langevin Boltzmann equation. Not only is the bulk case analyzed but also devices. In contrast to the well-known Monte Carlo method this new approach allows the investigation of the spatial origin of the terminal current noise. It is shown, that excess noise is mainly due to cold or warm electrons, whereas the contribution of hot electrons in a velocity-saturation region is negligible.
Keywords :
Boltzmann equation; Monte Carlo methods; hot carriers; semiconductor device models; semiconductor device noise; Langevin Boltzmann equation; excess noise; hot electrons; terminal current noise; velocity-saturation region; Analysis of variance; Boltzmann equation; Electrons; Fluctuations; Heat transfer; Impedance; Lattices; Monte Carlo methods; Scattering; Temperature sensors;
Conference_Titel :
Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European
Print_ISBN :
0-7803-9203-5
DOI :
10.1109/ESSDER.2005.1546652
