DocumentCode

2608520

Title

Low Field Time Dependent Dielectric Integrity

Author

Anolick, Eugene S. ; Nelson, Glenn R.

Author_Institution

International Business Machines Corporation, P.O. Box 390, Poughkeepsie, New York 12602

fYear

1979

fDate

28946

Firstpage

8

Lastpage

12

Keywords

Breakdown voltage; Dielectric devices; Dielectric substrates; FETs; Interference; Statistics; Surfaces; Temperature; Testing; Vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1979. 17th Annual

Conference_Location

San Diego, CA, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1979.362864

Filename

4208257