DocumentCode :
2608591
Title :
Analysis of SF6 Decomposition Byproducts under Two kinds of PD Defects
Author :
Lingyun, Wan ; Huayong, Liu ; Ju, Tang ; Qiang, Yao ; Xiaoxing, Zhang
Author_Institution :
Chongqing Electr. Power Test & Res. Inst., Chongqing Univ., Chongqing, China
fYear :
2008
fDate :
9-12 Nov. 2008
Firstpage :
430
Lastpage :
432
Abstract :
Based on the SF6 decomposition device, this article has constructed two typical physical models of insulation defects and then used gas chromatography (GC) instrument to analyze the decomposed components of SF6 under the two kinds of partial discharge (PD) defects. Preliminary tests show that SOF2 is the main product of SF6 decomposition under both the two kinds of defects, the amount of SOF2 increases significantly with the extension of discharge time and that the gas production rates of SOF2 are apparently different under the two different kinds of defects.
Keywords :
SF6 insulation; gas insulated substations; partial discharges; GIS; PD defects; SF6 decomposition byproducts; SOF2; gas chromatography instrument; gas insulated substation; insulation defects; partial discharge; testing; Acoustic signal detection; Acoustic testing; Dielectrics and electrical insulation; Electrodes; Fault location; Gas insulation; Geographic Information Systems; Partial discharges; Sulfur hexafluoride; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-3823-5
Electronic_ISBN :
978-1-4244-2810-6
Type :
conf
DOI :
10.1109/ICHVE.2008.4773965
Filename :
4773965
Link To Document :
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