Analysis of SF6 Decomposition Byproducts under Two kinds of PD Defects

Author

Lingyun, Wan ; Huayong, Liu ; Ju, Tang ; Qiang, Yao ; Xiaoxing, Zhang

Author_Institution

Chongqing Electr. Power Test & Res. Inst., Chongqing Univ., Chongqing, China

fYear

2008

fDate

9-12 Nov. 2008

Firstpage

430

Lastpage

432

Abstract

Based on the SF₆ decomposition device, this article has constructed two typical physical models of insulation defects and then used gas chromatography (GC) instrument to analyze the decomposed components of SF₆ under the two kinds of partial discharge (PD) defects. Preliminary tests show that SOF₂ is the main product of SF₆ decomposition under both the two kinds of defects, the amount of SOF₂ increases significantly with the extension of discharge time and that the gas production rates of SOF₂ are apparently different under the two different kinds of defects.

Keywords

SF₆ insulation; gas insulated substations; partial discharges; GIS; PD defects; SF₆ decomposition byproducts; SOF₂; gas chromatography instrument; gas insulated substation; insulation defects; partial discharge; testing; Acoustic signal detection; Acoustic testing; Dielectrics and electrical insulation; Electrodes; Fault location; Gas insulation; Geographic Information Systems; Partial discharges; Sulfur hexafluoride; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on

Conference_Location

Chongqing

Print_ISBN

978-1-4244-3823-5

Electronic_ISBN

978-1-4244-2810-6

Type

conf

DOI

10.1109/ICHVE.2008.4773965

Filename

4773965