• DocumentCode
    2608623
  • Title

    Automated solder joint inspection system using optical 3-D image detection

  • Author

    Matsuyama, Yukio ; Honda, Toshifumi ; Yamamura, Hisae ; Sasazawa, Hideaki ; Nomoto, Mineo ; Ninomiya, Takanori ; Schick, Anton ; Listl, Ludwig ; Kollensperger, P. ; Spriege, Dieter ; Mengel, Peter ; Schneider, Richard

  • Author_Institution
    Production Eng. Res. Lab., Hitachi Ltd., Yokohama, Japan
  • fYear
    1996
  • fDate
    2-4 Dec 1996
  • Firstpage
    116
  • Lastpage
    122
  • Abstract
    An automated system has been developed for visually inspecting the solder joints of SMDs (Surface Mounted Devices). The system is capable of inspecting fine pitch components down to 0.3 mm pitch QFPs (Quad Flat Packages). A unique image detection method was also developed to obtain precise 3-D images of solder joints. The principle of a confocal microscope is employed but plural sensors are used to detect reflected light at different focusing positions simultaneously. The system is unaffected by secondary reflection and dead angles. The warp in a PC (Printed Circuit) board surface is calculated in real time using the detected 3-D images, and board height to be detected in successive areas is predicted based on this calculation. Real-time automatic focusing control is then performed using newly developed defect detection algorithms, the system can recognize leads, pads and solder fillets from the detected images. Because 3-D shape features are extracted and used for defect judgment, user-defined parameters have been made easy to understand and/or to modify. Operational evaluation of the system confirms a 100% defect detection rate and a very low false alarm rate (0.16%)
  • Keywords
    automatic optical inspection; image recognition; soldering; surface mount technology; automated solder joint inspection system; confocal microscope; image detection method; optical 3D image detection; plural sensors; printed circuit board surface; surface mounted devices; visual inspection; Automatic control; Automatic optical inspection; Electronics packaging; Focusing; Microscopy; Optical reflection; Optical sensors; Printed circuits; Real time systems; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Computer Vision, 1996. WACV '96., Proceedings 3rd IEEE Workshop on
  • Conference_Location
    Sarasota, FL
  • Print_ISBN
    0-8186-7620-5
  • Type

    conf

  • DOI
    10.1109/ACV.1996.572014
  • Filename
    572014