DocumentCode :
2608630
Title :
A Metallographic Test for Glass-To-Metal Seal Quality
Author :
McCormick, John ; Zakraysek, Louis
Author_Institution :
RADC, Griffiss AFB, NY
fYear :
1979
fDate :
28946
Firstpage :
44
Lastpage :
50
Abstract :
Glass-to-metal seals on IC lead frames, transistor headers and other electronic component packages make it possible to obtain electrical feed-thru while maintaining hermeticity throughout severe environmental exposure such as that required by MIL-STD-883. In the more exacting applications, the hermeticity requirement is most consistently met by the use of the so-called matched seal. Many of these seals use ASTM Alloy F15 (Kovar) and a glass with matching coefficient of expansion. In practice, industry specialists do the glass-seal work and the component fabricator uses the purchased part to complete a hermetic assembly. Despite the widespread, and long-standing development of glass-seal technology, the industry seems plagued with component failure due to loss of hermeticity. This study describes the use of metallographic techniques for seal quality determination.
Keywords :
Electronic equipment testing; Glass industry; Integrated circuit testing; Lead; Material storage; Optical microscopy; Oxidation; Packaging; Seals; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1979. 17th Annual
Conference_Location :
San Diego, CA, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1979.362870
Filename :
4208263
Link To Document :
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