DocumentCode :
2608804
Title :
Integrated diagnosis-a hierarchical approach
Author :
Sheppard, John W. ; Simpson, William R.
Author_Institution :
ARINC Res. Corp., Annapolis, MD, USA
fYear :
1990
fDate :
17-21 Sep 1990
Firstpage :
477
Lastpage :
483
Abstract :
ARINC´s hierarchical model-based approach to integrated maintenance is described. The hierarchical approach is used in the diagnostic aids System Testability and Maintenance Program (STAMP) and Portable Interactive Troubleshooter (POINTER). The information-theoretic approach applied to achieve hierarchical diagnosis is described, and the effectiveness of STAMP and POINTER are described in detail. STAMP and POINTER have the following attributes: the single form of knowledge representation allows all diagnostic elements to function in a consistent manner, regardless of the type or level of maintenance; this knowledge representation can be used for testability analysis, including maintenance architecture and functional packaging; the models are hierarchical, making them easily adaptable to all levels of maintenance; the approach permits diagnosis to be dynamically tailored to the current context; and the models facilitate effective testability assessment, intelligent troubleshooting, and direct links to logistics databases. Thus, STAMP and POINTER, by using the information flow model, permit all aspects of the maintenance process to be addressed using a single method of knowledge representation and a single method of knowledge-base processing
Keywords :
automatic test equipment; automatic testing; hierarchical systems; knowledge based systems; knowledge representation; maintenance engineering; military computing; ARINC; POINTER; Portable Interactive Troubleshooter; STAMP; System Testability and Maintenance Program; functional packaging; information flow model; integrated diagnosis; integrated maintenance; intelligent troubleshooting; knowledge representation; knowledge-base processing; logistics databases; maintenance architecture; testability analysis; Automatic test equipment; Automatic testing; Investments; Job shop scheduling; Life testing; Manufacturing; Protocols; Research and development; System testing; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
Type :
conf
DOI :
10.1109/AUTEST.1990.111551
Filename :
111551
Link To Document :
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