DocumentCode
2608817
Title
A New Cyclic Biased T.H.B. Test for Power Dissipating IC´s
Author
Ajiki, T. ; Sugimoto, M. ; Higuchi, H. ; Kumada, S.
Author_Institution
Matsushita Electronics Corporation, Japan
fYear
1979
fDate
28946
Firstpage
118
Lastpage
126
Keywords
Absorption; Aluminum; Circuit testing; Corrosion; Electrical resistance measurement; Electronic equipment testing; Integrated circuit testing; Moisture measurement; Plastics; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1979. 17th Annual
Conference_Location
San Diego, CA, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1979.362880
Filename
4208273
Link To Document