DocumentCode :
2608817
Title :
A New Cyclic Biased T.H.B. Test for Power Dissipating IC´s
Author :
Ajiki, T. ; Sugimoto, M. ; Higuchi, H. ; Kumada, S.
Author_Institution :
Matsushita Electronics Corporation, Japan
fYear :
1979
fDate :
28946
Firstpage :
118
Lastpage :
126
Keywords :
Absorption; Aluminum; Circuit testing; Corrosion; Electrical resistance measurement; Electronic equipment testing; Integrated circuit testing; Moisture measurement; Plastics; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1979. 17th Annual
Conference_Location :
San Diego, CA, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1979.362880
Filename :
4208273
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2608817
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