• DocumentCode
    2608866
  • Title

    Integrated design for testability and automatic testing approaches

  • Author

    Esker, Eugene A. ; Martin, Jean-Paul ; Simpson, William R. ; Sheppard, John W.

  • Author_Institution
    ARINC Res. Corp., Annapolis, MD, USA
  • fYear
    1990
  • fDate
    17-21 Sep 1990
  • Firstpage
    509
  • Lastpage
    514
  • Abstract
    The Standard Modular Avionics Repair and Test (SMART) concept was developed to provide an approach to standardizing ATE (automatic test equipment,) architectures and making the ATE and test program set (TPS) a modular development process. The System Testability and Maintenance Program (STAMP) was developed to meet the need for designing testable systems and verifying the testability of systems. The Portable Interactive Troubleshooter (POINTER) was developed as an intelligent test executive to dynamically manipulate testability models. Using the SMART approach to automatic testing and the STAMP approach to design for testability, an approach for integrating the two with a dynamic tool-POINTER-into a complete architecture for ATE and TPS development is presented
  • Keywords
    CAD; aircraft instrumentation; automatic test equipment; automatic testing; computer architecture; interactive systems; maintenance engineering; modules; standards; ATE; POINTER; Portable Interactive Troubleshooter; SMART; STAMP; Standard Modular Avionics Repair and Test; System Testability and Maintenance Program; TPS; aircraft instrumentation; architectures; automatic test equipment; automatic testing; intelligent test executive; test program set; testability; Aerospace electronics; Automatic test equipment; Automatic testing; Computer architecture; Design for testability; Instruments; Software standards; Software testing; Standards development; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
  • Conference_Location
    San Antonio, TX
  • Type

    conf

  • DOI
    10.1109/AUTEST.1990.111555
  • Filename
    111555