DocumentCode :
2608866
Title :
Integrated design for testability and automatic testing approaches
Author :
Esker, Eugene A. ; Martin, Jean-Paul ; Simpson, William R. ; Sheppard, John W.
Author_Institution :
ARINC Res. Corp., Annapolis, MD, USA
fYear :
1990
fDate :
17-21 Sep 1990
Firstpage :
509
Lastpage :
514
Abstract :
The Standard Modular Avionics Repair and Test (SMART) concept was developed to provide an approach to standardizing ATE (automatic test equipment,) architectures and making the ATE and test program set (TPS) a modular development process. The System Testability and Maintenance Program (STAMP) was developed to meet the need for designing testable systems and verifying the testability of systems. The Portable Interactive Troubleshooter (POINTER) was developed as an intelligent test executive to dynamically manipulate testability models. Using the SMART approach to automatic testing and the STAMP approach to design for testability, an approach for integrating the two with a dynamic tool-POINTER-into a complete architecture for ATE and TPS development is presented
Keywords :
CAD; aircraft instrumentation; automatic test equipment; automatic testing; computer architecture; interactive systems; maintenance engineering; modules; standards; ATE; POINTER; Portable Interactive Troubleshooter; SMART; STAMP; Standard Modular Avionics Repair and Test; System Testability and Maintenance Program; TPS; aircraft instrumentation; architectures; automatic test equipment; automatic testing; intelligent test executive; test program set; testability; Aerospace electronics; Automatic test equipment; Automatic testing; Computer architecture; Design for testability; Instruments; Software standards; Software testing; Standards development; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
Type :
conf
DOI :
10.1109/AUTEST.1990.111555
Filename :
111555
Link To Document :
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