Title :
A New Screening Method for Optocouplers and LEDS
Author :
Takahashi, T. ; Todoroki, S. ; Mitani, S.
Author_Institution :
Production Engineering Research Laboratory, Hitachi, Ltd., 292 Yoshida-machi, Totsuka-ku, Yokohama, Japan
Abstract :
In order to develop a non-destructive method to screen LEDs and couplers that degrade earlier under high temperature bias conditions, the relation between the degradation of emission efficiency and the initial reverse recovery time of LEDs has been investigated. The results show that those devices with shorter recovery time degrade faster.
Keywords :
Couplers; Degradation; Failure analysis; Gallium arsenide; Laboratories; Life testing; Light emitting diodes; Production engineering; Temperature sensors; Time measurement;
Conference_Titel :
Reliability Physics Symposium, 1979. 17th Annual
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/IRPS.1979.362888
