DocumentCode
2608954
Title
A New Screening Method for Optocouplers and LEDS
Author
Takahashi, T. ; Todoroki, S. ; Mitani, S.
Author_Institution
Production Engineering Research Laboratory, Hitachi, Ltd., 292 Yoshida-machi, Totsuka-ku, Yokohama, Japan
fYear
1979
fDate
28946
Firstpage
167
Lastpage
170
Abstract
In order to develop a non-destructive method to screen LEDs and couplers that degrade earlier under high temperature bias conditions, the relation between the degradation of emission efficiency and the initial reverse recovery time of LEDs has been investigated. The results show that those devices with shorter recovery time degrade faster.
Keywords
Couplers; Degradation; Failure analysis; Gallium arsenide; Laboratories; Life testing; Light emitting diodes; Production engineering; Temperature sensors; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1979. 17th Annual
Conference_Location
San Diego, CA, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1979.362888
Filename
4208281
Link To Document