Title :
Design considerations in low level analog test systems
Author :
Kirsop, Doug ; Yeager, John
Author_Institution :
Keithley Instrum. Inc., Cleveland, OH, USA
Abstract :
The integrity of low-level analog measurements in an automatic test system is comprised by many possible error sources. These errors can cause readings by even the most accurate instruments to be inaccurate. Many of these errors can be attributed to the signal switching. Methods and techniques used to minimizes or eliminate these errors are discussed. Low-current, high-resistance, and low-voltage measurements are examined, and a multiplex test system and a matrix test system are considered as system examples
Keywords :
automatic test equipment; electric current measurement; electric resistance measurement; interference (signal); interference suppression; measurement errors; random noise; voltage measurement; automatic test; error sources; interference; leakage currents; low current measurement; low-level analog measurements; low-voltage measurements; matrix test system; multiplex test system; noise; shielding; signal switching; Automatic testing; Hardware; Instruments; Interference; Noise level; Switches; System testing; Thermal resistance; Voltage; Working environment noise;
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
DOI :
10.1109/AUTEST.1990.111564
