DocumentCode :
2609068
Title :
Integrated diagnostics from a concurrent engineering perspective
Author :
Giordano, Paul J. ; Nolan, Mary
Author_Institution :
Giordano Associates Inc., Pine Brook, NJ, USA
fYear :
1990
fDate :
17-21 Sep 1990
Firstpage :
589
Lastpage :
594
Abstract :
Integrated diagnostics (ID) issues, drivers, problems, solutions, and implementation are discussed. It is concluded that budget cuts in the 1990s and the severity of the operational problems will force implementation of ID in the military. It is suggested that concurrent engineering will be the vehicle for ID implementation. ID as a key strategy for the implementation of concurrent engineering is explored. New DoD (US Department of Defense) requirements include the need for concurrent engineering and total quality management. It is argued that ignoring these initiatives as merely DoD´s latest buzzwords may put companies at a major disadvantage in acquiring new defense business. Concurrent engineering requires that manufacturing and support be considered up-front in the design process. Integrated diagnostics is considered as a process discipline that bridges the design-manufacturing-support gap
Keywords :
automatic test equipment; automatic testing; electronic equipment testing; military systems; DoD; US Department of Defense; concurrent engineering; defense business; integrated diagnostics; military systems; total quality management; Automatic testing; Companies; Concurrent engineering; Defense industry; Logistics; Management training; Personnel; Process design; Systems engineering and theory; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
Type :
conf
DOI :
10.1109/AUTEST.1990.111565
Filename :
111565
Link To Document :
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