DocumentCode :
2609077
Title :
Enhancing solder joint fatigue life for ball grid array packages
Author :
Wei, Zhou ; Kuan, Lim Beng
Author_Institution :
Res. & Dev., Micron Semicond. Asia Pte Ltd, Singapore, Singapore
fYear :
2003
fDate :
10-12 Dec. 2003
Firstpage :
701
Lastpage :
706
Abstract :
Solder joint fatigue failure is quite common in plastic ball grid array (BGA) packages. Accurately predicting solder joint fatigue life and developing advanced, efficient techniques of enhancing solder joint reliability are essential to package development. In this paper, a finite element model is created to simulate the thermal-mechanical behavior of solder joints in the thermal cycling environment. Darveaux´s physical model is employed to study solder joint fatigue failure caused by crack initiation and propagation. Environmental tests are also conducted and agree with the simulation results. In an effort to improve the margin of solder joint fatigue life by enhancing solder joint reliability, two alternatives to conventional eutectic solder balls are explored: 1) solder balls with interior polymer cores; and 2) solder balls with circumferential polymer collars. Finite element simulations are performed on each to verify the effectiveness of these special solder balls. The results show that solder joint fatigue life can be significantly improved. Mechanical samples are built using these two ball enhancements, and shear and environmental tests conducted on them corroborate the simulation predictions.
Keywords :
ball grid arrays; fatigue; finite element analysis; integrated circuit modelling; integrated circuit reliability; plastic packaging; shear strength; thermal stress cracking; Darveaux physical model; ball grid array packages; circumferential polymer collars; crack initiation; crack propagation; environmental tests; eutectic solder balls; finite element model; interior polymer core solder balls; joint thermal-mechanical behavior; plastic BGA packages; shear tests; solder joint fatigue failure; solder joint fatigue life; solder joint reliability; thermal cycling; Electronics packaging; Fatigue; Finite element methods; Frequency; Polymers; Predictive models; Semiconductor device packaging; Soldering; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
Print_ISBN :
0-7803-8205-6
Type :
conf
DOI :
10.1109/EPTC.2003.1271609
Filename :
1271609
Link To Document :
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