DocumentCode :
2609138
Title :
Application of Iterative Curve-Fitting Method in Separating Overlapped Peaks of SF6 Decomposed Products
Author :
Xiao-xing, Zhang ; Yao, Yao ; Hao, Xiong ; Ju, Tang ; Jiang-bo, Ren
Author_Institution :
State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Chongqing Univ., Chongqing, China
fYear :
2008
fDate :
9-12 Nov. 2008
Firstpage :
535
Lastpage :
538
Abstract :
The SF6 decomposed products are very alike, so the peaks of the SF6 decomposed products are overlapped. It make us hard to quantitative calculate. This paper introduced a method to seperate the overlapped chromatogram peaks with iterative curve-fitting and Gauss function, and deduced the formula of the iterative curve-fitting; provided a method to calculate the initial value of the peaks intensity and width by iterative formula, and confirm the final peaks intensity and width to seperate the overlapped signals. By the analysis of the real chromatogragh data, it proved the validity of this method on the main components used in distinguishing the GIS internal defects. This method overcomes the influence of SF6 peak to the other thin concentration peaks, so it can use on the study of the quantitative analysis of the decomposed products on different failures and different voltages.
Keywords :
SF6 insulation; iterative methods; GIS internal defects; Gauss function; SF6 decomposed products; chromatogragh data; iterative curve-fitting method; iterative formula; overlapped chromatogram peaks; Curve fitting; Gas chromatography; Gaussian processes; Geographic Information Systems; Insulation; Iterative methods; Mathematical model; Partial discharges; Sulfur hexafluoride; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-3823-5
Electronic_ISBN :
978-1-4244-2810-6
Type :
conf
DOI :
10.1109/ICHVE.2008.4773991
Filename :
4773991
Link To Document :
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