DocumentCode :
2609284
Title :
Object recognition using multiple view invariance based on complex features
Author :
Kuno, Yoshinori ; Takae, Osamu ; Takahashi, Takuya ; Shirai, Yoshiaki
Author_Institution :
Osaka Univ., Japan
fYear :
1996
fDate :
2-4 Dec 1996
Firstpage :
129
Lastpage :
134
Abstract :
Geometric invariants from multiple views provide useful information for 3D object recognition. However, conventional object recognition methods using invariants based on point features cannot achieve efficient recognition because of large amount of combinations of point features in invariant calculation. To avoid this problem, the authors propose to use more complex features. They adopt arrow junctions and conics as complex features because man-made objects have often trihedral polyhedra (eg. parallelepiped) and circles and they make arrow junctions and conics in images, respectively. The multiple view affine invariance theory can be directly used for arrow junctions. For conics, they propose two types of invariants. They have developed an object recognition method exploiting these invariants. In addition to the recognition method with two input images, they propose a recognition method that needs only a single input image by substituting an image of a target object stored in the model library. Experimental results using 240 pair of images for 24 objects confirm the usefulness of the methods
Keywords :
computational geometry; feature extraction; image recognition; object recognition; stereo image processing; 3D object recognition; arrow junctions; circles; complex features; conics; geometric invariants; images; input images; man-made objects; model library; multiple view affine invariance theory; multiple view invariance; point features; target object; trihedral polyhedra; Calibration; Cameras; Image recognition; Libraries; Object recognition; Shape; Solid modeling; Stereo vision; Target recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Computer Vision, 1996. WACV '96., Proceedings 3rd IEEE Workshop on
Conference_Location :
Sarasota, FL
Print_ISBN :
0-8186-7620-5
Type :
conf
DOI :
10.1109/ACV.1996.572017
Filename :
572017
Link To Document :
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