• DocumentCode
    2609329
  • Title

    Simulation with ideal switch models combined with measured loss data provides a good estimate of power loss

  • Author

    Munk-Nielsen, Stig ; Tutelea, Lucian N. ; Jæger, Ulrik

  • Author_Institution
    Inst. of Energy Technol., Aalborg Univ., Denmark
  • Volume
    5
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    2915
  • Abstract
    Ideally, converter losses should be determined without using an excessive amount of simulation time. State-of-the-art power semiconductor models provide good accuracy; unfortunately they often require a very long simulation time. This paper describes how to estimate power losses from simulation using ideal switches combined with measured power loss data. The semiconductor behavior is put into a look-up table, which replaces the advanced semiconductor models and shortens the simulation time. To extract switching and conduction losses, converter is simulated and the semiconductor power losses are estimated. Measurement results on a laboratory converter are compared with the estimated losses and a good agreement is shown. Using the ideal switch simulation and the post processing power estimation program, a ten to twenty fold increase in simulation speed is obtained, compared to simulations using advanced models of semiconductors
  • Keywords
    insulated gate bipolar transistors; loss measurement; parameter estimation; power convertors; power semiconductor switches; semiconductor device models; IGBT; conduction losses; converter losses; ideal switch models; ideal switch simulation; look-up table; measured loss data; post processing power estimation program; power loss estimation; semiconductor behavior; semiconductor power losses; simulation time; state-of-the-art power semiconductor models; Energy loss; Loss measurement; Power dissipation; Power electronics; Power semiconductor switches; Semiconductor diodes; Table lookup; Testing; Thermal stresses; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
  • Conference_Location
    Rome
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-6401-5
  • Type

    conf

  • DOI
    10.1109/IAS.2000.882580
  • Filename
    882580