Title :
The Impact of Bubble Defects on Performance and Reliability
Author :
Hsieh, W.J. ; Hsin, C.H. ; Chi, H.C. ; Chen, T.T.
Author_Institution :
Rockwell International, Newport Beach, CA 92663, (714) 833-4079
Conference_Titel :
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1980.362916
