DocumentCode :
2609586
Title :
Perspectives in Component Failure Analysis
Author :
Sie, Charles H.
Author_Institution :
Xerox Corp., 701 S. Aviation Blvd., El Segundo, Ca. 90245
fYear :
1980
fDate :
29312
Firstpage :
100
Lastpage :
100
Keywords :
Circuit testing; Costs; Delay; Electronics industry; Failure analysis; Industrial electronics; Manufacturing processes; Microelectronics; Physics; TV;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1980.362921
Filename :
4208317
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2609586
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