DocumentCode

2609586

Title

Perspectives in Component Failure Analysis

Author

Sie, Charles H.

Author_Institution

Xerox Corp., 701 S. Aviation Blvd., El Segundo, Ca. 90245

fYear

1980

fDate

29312

Firstpage

100

Lastpage

100

Keywords

Circuit testing; Costs; Delay; Electronics industry; Failure analysis; Industrial electronics; Manufacturing processes; Microelectronics; Physics; TV;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1980. 18th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1980.362921

Filename

4208317