• DocumentCode
    2609858
  • Title

    An accurate AC characteristic table look-up model for VLSI analog circuit simulation applications

  • Author

    Cho, Dae-Hyung ; Kang, S.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    1993
  • fDate
    3-6 May 1993
  • Firstpage
    1531
  • Abstract
    A new accurate table look-up method is presented for modeling both I-V characteristics and C-V and/or Q-V characteristics of deep submicron MOSFETs for VLSI analog circuit simulation. Based on the linear and quadratic isoparametric shape functions, the proposed table lookup approach can accurately model complicated AC characteristics of MOSFETs. The charges and capacitances derived through integration of C-V characteristics and differentiation of Q-V characteristics match the original measured data at table grid points. The proposed table lookup model accurately fits the deep submicron MOSFET´s I-V characteristics as well. It is shown that AC small-signal and transient simulations of CMOS operational amplifier circuits using the proposed table lookup approach are exactly matched to those with the Ward and Dutton model in the simulation program with IC emphasis (SPICE)2 when AC table data are generated from the Ward and Dutton model
  • Keywords
    CMOS analogue integrated circuits; SPICE; VLSI; circuit analysis computing; integrated circuit modelling; operational amplifiers; table lookup; AC characteristic; CMOS operational amplifier circuits; I-V characteristics; Q-V characteristics; SPICE; VLSI; Ward and Dutton model; analog circuit simulation; deep submicron MOSFETs; isoparametric shape functions; table grid points; table look-up model; Analog circuits; Capacitance; Capacitance-voltage characteristics; Circuit simulation; Integrated circuit modeling; MOSFETs; Semiconductor device modeling; Shape; Table lookup; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • DOI
    10.1109/ISCAS.1993.394027
  • Filename
    394027