DocumentCode
2609887
Title
Mechanism of Ceramic Capacitor Leakage Failures due to Low DC Stress
Author
Sato, Ken ; Ogata, Yoshihiro ; Ohno, Katsuhiro ; Ikeo, Hirofumi
Author_Institution
Central Research Laboratory, Mitsubishi Electric Corporation, Amagasaki, Japan
fYear
1980
fDate
29312
Firstpage
205
Lastpage
212
Abstract
Ceramic capacitors failed insulation resistance testing at dc voltages far below their rated voltages. Using improved techniques of microanalysis and electrochemical methods, we found that failures resulted from electromigration of electrode materials through a small space in dielectrics filled with a solution containing Cl ions. This mechanism could explain electrical behaviours of failed capacitors.
Keywords
Capacitors; Ceramics; Dielectric materials; Dielectrics and electrical insulation; Electric resistance; Electrodes; Electromigration; Insulation testing; Stress; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1980.362940
Filename
4208336
Link To Document