Title :
Mechanism of Ceramic Capacitor Leakage Failures due to Low DC Stress
Author :
Sato, Ken ; Ogata, Yoshihiro ; Ohno, Katsuhiro ; Ikeo, Hirofumi
Author_Institution :
Central Research Laboratory, Mitsubishi Electric Corporation, Amagasaki, Japan
Abstract :
Ceramic capacitors failed insulation resistance testing at dc voltages far below their rated voltages. Using improved techniques of microanalysis and electrochemical methods, we found that failures resulted from electromigration of electrode materials through a small space in dielectrics filled with a solution containing Cl ions. This mechanism could explain electrical behaviours of failed capacitors.
Keywords :
Capacitors; Ceramics; Dielectric materials; Dielectrics and electrical insulation; Electric resistance; Electrodes; Electromigration; Insulation testing; Stress; Voltage;
Conference_Titel :
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1980.362940
