DocumentCode

2609944

Title

Failure Analysis of Multilayer Ceramic Substrates

Author

Walker, G.A.

Author_Institution

D/875 B/300-41C, IBM Corporation, Hopewell Junction, N.Y. 12533

fYear

1980

fDate

29312

Firstpage

227

Lastpage

231

Keywords

Ceramics; Failure analysis; Glass; Lead; Nonhomogeneous media; Semiconductor device measurement; Stress measurement; Substrates; Temperature; Tin;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1980. 18th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1980.362944

Filename

4208340