DocumentCode :
2609948
Title :
Measuring Pole Tip Recession With Atomic Force Microscope Pitfalls And Solutions
Author :
Babcock, K. ; Hopkins, P.
Author_Institution :
Digital Instruments, Inc.
fYear :
1997
fDate :
1-4 April 1997
Keywords :
Atomic force microscopy; Atomic measurements; Force measurement; Hysteresis; Instruments; Magnetic force microscopy; Magnetic heads; Magnetoresistance; Phase measurement; Stress measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597413
Filename :
597413
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2609948
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