Title :
Data Retention in EPROMS
Author :
Shiner, R.E. ; Caywood, J.M. ; Euzent, B.L.
Author_Institution :
INTEL CORPORATION, Santa Clara, California 95051, (408) 987-8080
Keywords :
Application software; EPROM; Electron traps; Error correction; Microprocessors; Nonvolatile memory; PROM; System software; Variable structure systems; Voltage;
Conference_Titel :
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1980.362947
