DocumentCode

2609988

Title

Data Retention in EPROMS

Author

Shiner, R.E. ; Caywood, J.M. ; Euzent, B.L.

Author_Institution

INTEL CORPORATION, Santa Clara, California 95051, (408) 987-8080

fYear

1980

fDate

29312

Firstpage

238

Lastpage

243

Keywords

Application software; EPROM; Electron traps; Error correction; Microprocessors; Nonvolatile memory; PROM; System software; Variable structure systems; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1980. 18th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1980.362947

Filename

4208343