Collection of Alpha-Particle-Generated Charge by VLSI Device Structures

Author

May, T.C. ; Ward, B.F.L. ; Jenq, C.S.

Author_Institution

Intel Corporation, Santa Clara, CA

fYear

1980

fDate

29312

Firstpage

268

Lastpage

268

Keywords

Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1980. 18th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

DOI

10.1109/IRPS.1980.362952

Filename

4208348

Link To Document