Title :
Collection of Alpha-Particle-Generated Charge by VLSI Device Structures
Author :
May, T.C. ; Ward, B.F.L. ; Jenq, C.S.
Author_Institution :
Intel Corporation, Santa Clara, CA
Keywords :
Very large scale integration;
Conference_Titel :
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1980.362952
