DocumentCode
2610071
Title
Error identification and data retrieval in signature analysis based data compaction
Author
Sun, Xiaoling ; Tutak, Wes
Author_Institution
Dept. of Electr. Eng., Alberta Univ., Edmonton, Alta., Canada
fYear
1996
fDate
6-8 Nov 1996
Firstpage
177
Lastpage
184
Abstract
A novel multiple error identification and data retrieval technique for multiple input shift register (MISR) based signature analysis environment is presented. Utilizing existing BIST resources and using a second MISR, it is capable of identifying any number errors in an input data stream and fully recovering the information lost during signature compaction. The application of this technique in a IC level fault diagnosis scheme is given
Keywords
automatic testing; built-in self test; data compression; error analysis; error detection; fault diagnosis; integrated circuit testing; logic testing; BIST resources; IC level fault diagnosis scheme; MISR based signature analysis environment; data compaction; data retrieval technique; multiple error identification; multiple input shift register; Application specific integrated circuits; Built-in self-test; Compaction; Data analysis; Fault diagnosis; Feedback; Information retrieval; Polynomials; Shift registers; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1550-5774
Print_ISBN
0-8186-7545-4
Type
conf
DOI
10.1109/DFTVS.1996.572023
Filename
572023
Link To Document