Title :
Experimental results from IDDF testing
Author :
Thibeault, C. ; Payeur, A.
Author_Institution :
Dept. de Genie Electr., Ecole de Technologie Superieure, Montreal, Que., Canada
Abstract :
In this paper, we present experimental results from a test method, called IDDF testing, based on the multiple sampling and processing of the consumption current, IDD. This method can be seen as an extension of IDDQ testing since the IDD frequency spectrum, instead of DC levels, is used to detect defects or faults. The results show that our method is less sensitive to noise than IDDQ testing
Keywords :
VLSI; digital integrated circuits; integrated circuit testing; logic testing; signal sampling; IDDF testing; consumption current; multiple sampling; CMOS technology; Electronic equipment testing; Electronics industry; Face detection; Fault detection; Frequency; Logic testing; Microelectronics; Sampling methods; Signal processing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
0-8186-7545-4
DOI :
10.1109/DFTVS.1996.572024
