Title :
Compact and highly testable error indicator for self-checking circuits
Author :
Metra, Cecilia ; Favalli, Michele ; Ricco, Bruno
Author_Institution :
Dipt. di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
Abstract :
A novel error indicator is proposed, which can be directly connected to the outputs of the checker of a self-checking circuit to memorize, until reset, the error indication possibly produced, independently of the successively given output words. The proposed error indicator features high on-line self-testing ability with respect to realistic faults, and a compact structure
Keywords :
built-in self test; circuit testing; errors; compact structure; error indicator; on-line self-testing; self-checking circuit; Aerospace electronics; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Error correction; Fault detection; Fault tolerant systems; Latches;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
0-8186-7545-4
DOI :
10.1109/DFTVS.1996.572026
