DocumentCode :
2610186
Title :
An IR Microscopy Technique for Failure Analysis of Suspected Metallization Corrosion
Author :
Wagner, Lawrence C.
Author_Institution :
Texas Instruments Incorporated, P.O. Box 225012, M/S 74, Dallas, Texas 75265
fYear :
1980
fDate :
29312
Firstpage :
318
Lastpage :
319
Abstract :
The unequivocal indentification of metallization corrosion on humidity related failures has been a considerable problem. While fuming acid decapsulations are normally a reliable means of decapsulation without an attack on aluminum metallization, some question concerning possible aluminum attack during such precedures can be inevitable. Dry mechanical decapsulations are definative but not 100% effective and limit further electrical analysis. They are destructive to bonding if any further analysis is to be attempted in the absence of metal corrosion. A technique employing an infrared microscope has been successfully used to locate metal corrosion prior to exposing the active face of the bar and maintaining pin integrity for further analysis.
Keywords :
Aluminum; Corrosion; Failure analysis; Metallization; Microscopy; Optical distortion; Packaging; Pins; Plastics; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1980.362959
Filename :
4208355
Link To Document :
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