• DocumentCode
    2610186
  • Title

    An IR Microscopy Technique for Failure Analysis of Suspected Metallization Corrosion

  • Author

    Wagner, Lawrence C.

  • Author_Institution
    Texas Instruments Incorporated, P.O. Box 225012, M/S 74, Dallas, Texas 75265
  • fYear
    1980
  • fDate
    29312
  • Firstpage
    318
  • Lastpage
    319
  • Abstract
    The unequivocal indentification of metallization corrosion on humidity related failures has been a considerable problem. While fuming acid decapsulations are normally a reliable means of decapsulation without an attack on aluminum metallization, some question concerning possible aluminum attack during such precedures can be inevitable. Dry mechanical decapsulations are definative but not 100% effective and limit further electrical analysis. They are destructive to bonding if any further analysis is to be attempted in the absence of metal corrosion. A technique employing an infrared microscope has been successfully used to locate metal corrosion prior to exposing the active face of the bar and maintaining pin integrity for further analysis.
  • Keywords
    Aluminum; Corrosion; Failure analysis; Metallization; Microscopy; Optical distortion; Packaging; Pins; Plastics; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1980. 18th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1980.362959
  • Filename
    4208355