DocumentCode :
261019
Title :
Analysis of different transparent conductive thin films element on monocrystalline silicon cell
Author :
Selamat, Ali ; Misran, N. ; Islam, Mohammad Tariqul ; Mansor, Mohd Fais
fYear :
2014
fDate :
15-18 Jan. 2014
Firstpage :
1
Lastpage :
2
Abstract :
An analysis of phase response from different types of transparent conductive thin film is presented in this paper. Surface current performance of each film which was shaped with triangular loop shape is then investigated. It has been demonstrated from the CST simulated results that element of Kapton film exhibits the best scattering parameter performance with bandwidth over 15% and linear phase range over 360°.
Keywords :
elemental semiconductors; silicon; thin films; CST; Kapton film; monocrystalline silicon cell; phase response; scattering parameter performance; surface current performance; transparent conductive thin films element; triangular loop shape; Bandwidth; Current density; Films; Indium tin oxide; Reflection; Reflector antennas; Silicon; bandwidth; conductive thin film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Information and Communications (ICEIC), 2014 International Conference on
Conference_Location :
Kota Kinabalu
Type :
conf
DOI :
10.1109/ELINFOCOM.2014.6914433
Filename :
6914433
Link To Document :
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