DocumentCode
261019
Title
Analysis of different transparent conductive thin films element on monocrystalline silicon cell
Author
Selamat, Ali ; Misran, N. ; Islam, Mohammad Tariqul ; Mansor, Mohd Fais
fYear
2014
fDate
15-18 Jan. 2014
Firstpage
1
Lastpage
2
Abstract
An analysis of phase response from different types of transparent conductive thin film is presented in this paper. Surface current performance of each film which was shaped with triangular loop shape is then investigated. It has been demonstrated from the CST simulated results that element of Kapton film exhibits the best scattering parameter performance with bandwidth over 15% and linear phase range over 360°.
Keywords
elemental semiconductors; silicon; thin films; CST; Kapton film; monocrystalline silicon cell; phase response; scattering parameter performance; surface current performance; transparent conductive thin films element; triangular loop shape; Bandwidth; Current density; Films; Indium tin oxide; Reflection; Reflector antennas; Silicon; bandwidth; conductive thin film;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Information and Communications (ICEIC), 2014 International Conference on
Conference_Location
Kota Kinabalu
Type
conf
DOI
10.1109/ELINFOCOM.2014.6914433
Filename
6914433
Link To Document