Title :
A functional-level testability evaluation using a new M-testability approach
Author :
Jamoussi, M. ; Kaminska, B.
Author_Institution :
Ecole Polytech. de Montreal, Que., Canada
Abstract :
A new M-testability approach is introduced. M-testability is based on the variable testability measure (VTM), developed for data-path test prediction in high-level synthesis. For particular forms of arrays (iterative logic arrays of identical cells), the C-testability concept is appropriate to evaluate their testability using a one-faulty cell model. This concept is extended to M-testability to deal with more general arrays (of nonidentical cells or functional primitives in datapaths). The elaboration of the M-testability concept leads to the development of a classified-level approach. Some data-path examples are treated to show the practical application of the proposed technique in high-level synthesis
Keywords :
fault diagnosis; high level synthesis; iterative methods; logic arrays; logic testing; M-testability approach; classified-level approach; data-path test prediction; functional primitives; functional-level testability evaluation; high-level synthesis; iterative logic arrays; nonidentical cells; one-faulty cell model; variable testability measure; Circuit testing; Costs; High level synthesis; Integrated circuit testing; Large scale integration; Logic arrays; Logic circuits; Logic design; Logic testing; Process design;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1281-3
DOI :
10.1109/ISCAS.1993.394047
