Title :
Humidity Activated Surface Leakage Paths on T.O. Case Style Glass Headers
Author :
Calderbank, James M. ; Holloway, Paul
Author_Institution :
E-Systems, ECI Division, 1501 72nd Street North, P.O. Box 12248, St. Petersburg, FL 33733. (813) 381-2000
Abstract :
This paper reviews the analysis of exterior leakage paths causing failures of common 2N2222A transistors. The failure mechanism, exterior leakage paths activated in high humidity conditions on the surface of glass seals, is identified. The glass constituents which are responsible for this intermittent, sometime self-correcting failure mechanism are discussed and the method of conduction analyzed.
Keywords :
Chromium; Failure analysis; Glass; History; Humidity; Iron; Seals; Temperature; Testing; Zinc;
Conference_Titel :
Reliability Physics Symposium, 1981. 19th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1981.362974
